• DocumentCode
    1114378
  • Title

    Characteristic lengths for steady-state transport in illuminated, intrinsic a-Si:H

  • Author

    Hubin, Jacques ; Sauvain, Evelyne ; Shah, Arvind V.

  • Author_Institution
    Inst. of Microtech., Neuchatel Univ., Switzerland
  • Volume
    36
  • Issue
    12
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    2789
  • Lastpage
    2797
  • Abstract
    The steady-state transport equations are solved for a general small-signal case. This solution leads to the spatial distribution of the carriers in the bulk of undoped hydrogenated amorphous silicon (a-Si:H) under illumination. The general small-signal differential equations for electrons and holes, including a local and/or external electric field, are first established. Subsequently, the analysis is restricted to the case with a negligible external electric field. Two characteristic lengths appear in the analytical solution. They are interpreted for the lifetime regime as the ambipolar diffusion length and the dielectric relaxation length. Depending on the material parameters, one or the other of these lengths dominates the transport. Illustrative numerical examples for typical solar-cell-quality a-Si:H are given
  • Keywords
    amorphous semiconductors; carrier lifetime; dielectric relaxation; electrical conductivity of amorphous semiconductors and insulators; elemental semiconductors; hydrogen; partial differential equations; photoconductivity; silicon; solar cells; Si:H; ambipolar diffusion length; amorphous semiconductors; carrier spatial distribution; characteristic lengths; dielectric relaxation length; general small-signal differential equations; illumination; material parameters; solar cell; steady-state transport equations; Amorphous silicon; Charge carrier processes; Closed-form solution; Dielectric materials; Differential equations; Nonlinear equations; Poisson equations; Radiative recombination; Semiconductor materials; Steady-state;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.40939
  • Filename
    40939