DocumentCode
1114407
Title
Electron velocity overshoot in the collector depletion layer of AlGaAs/GaAs HBT´s
Author
Yamauchi, Yoshiki ; Ishibashi, Tadab
Author_Institution
NTT Electrical Communication Laboratories, Kanagawa, Japan
Volume
7
Issue
12
fYear
1986
fDate
12/1/1986 12:00:00 AM
Firstpage
655
Lastpage
657
Abstract
Electron velocity in the collector depletion layer of AlGaAs/ GaAs heterojunction bipolar transistors (HBT´s) is characterized by analyzing the cutoff frequencies. The ft value of tested HBT´s was 40 GHz at a collector voltage VCE of 2 V, and it significantly decreased to 27 GHz at VCE = 5 V. A conventional model assuming a constant electron velocity in the collector depletion region does not account for this ft variation. A new simple model composed of a velocity overshoot region and a saturation velocity region is proposed and it successfully explains the variation.
Keywords
Capacitance measurement; Cutoff frequency; Doping; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Information analysis; Testing; Transient analysis; Voltage;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1986.26509
Filename
1486332
Link To Document