• DocumentCode
    1114407
  • Title

    Electron velocity overshoot in the collector depletion layer of AlGaAs/GaAs HBT´s

  • Author

    Yamauchi, Yoshiki ; Ishibashi, Tadab

  • Author_Institution
    NTT Electrical Communication Laboratories, Kanagawa, Japan
  • Volume
    7
  • Issue
    12
  • fYear
    1986
  • fDate
    12/1/1986 12:00:00 AM
  • Firstpage
    655
  • Lastpage
    657
  • Abstract
    Electron velocity in the collector depletion layer of AlGaAs/ GaAs heterojunction bipolar transistors (HBT´s) is characterized by analyzing the cutoff frequencies. The ftvalue of tested HBT´s was 40 GHz at a collector voltage VCEof 2 V, and it significantly decreased to 27 GHz at VCE= 5 V. A conventional model assuming a constant electron velocity in the collector depletion region does not account for this ftvariation. A new simple model composed of a velocity overshoot region and a saturation velocity region is proposed and it successfully explains the variation.
  • Keywords
    Capacitance measurement; Cutoff frequency; Doping; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Information analysis; Testing; Transient analysis; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1986.26509
  • Filename
    1486332