DocumentCode
1116731
Title
Mobility degradation and transferred electron effect in gallium arsenide and indium gallium arsenide
Author
Arora, Vijay K. ; Mui, David S.L. ; Morkoc, Hadis
Author_Institution
Wilkes College, Wilkes-Barre, PA
Volume
34
Issue
6
fYear
1987
fDate
6/1/1987 12:00:00 AM
Firstpage
1231
Lastpage
1238
Abstract
The effect of mobility degradation on the intervalley transfer of electrons in gallium arsenide and indium gallium arsenide is studied. A considerable degradation of the mobility at high electric fields takes place for valleys with high low-field ohmic mobility. The momentum relaxation time τ = m*µ/e is found to degrade with high electric field, giving the impression of high collision broadening at high electric fields. Similar degradation is expected for the mean free path. The relationship of the high-field transport in terms of ohmic transport parameters is elaborated to explain the transferred electron effect.
Keywords
Electron mobility; Epitaxial layers; Gallium arsenide; Germanium; Gunn devices; Indium gallium arsenide; Indium phosphide; Substrates; Temperature; Thermal degradation;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1987.23075
Filename
1486786
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