• DocumentCode
    1116731
  • Title

    Mobility degradation and transferred electron effect in gallium arsenide and indium gallium arsenide

  • Author

    Arora, Vijay K. ; Mui, David S.L. ; Morkoc, Hadis

  • Author_Institution
    Wilkes College, Wilkes-Barre, PA
  • Volume
    34
  • Issue
    6
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    1231
  • Lastpage
    1238
  • Abstract
    The effect of mobility degradation on the intervalley transfer of electrons in gallium arsenide and indium gallium arsenide is studied. A considerable degradation of the mobility at high electric fields takes place for valleys with high low-field ohmic mobility. The momentum relaxation time τ = m*µ/e is found to degrade with high electric field, giving the impression of high collision broadening at high electric fields. Similar degradation is expected for the mean free path. The relationship of the high-field transport in terms of ohmic transport parameters is elaborated to explain the transferred electron effect.
  • Keywords
    Electron mobility; Epitaxial layers; Gallium arsenide; Germanium; Gunn devices; Indium gallium arsenide; Indium phosphide; Substrates; Temperature; Thermal degradation;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.23075
  • Filename
    1486786