• DocumentCode
    1118384
  • Title

    A Combinatorial Solution to the Reliability of Interwoven Redundant Logic Networks

  • Author

    Abraham, Jacob A.

  • Author_Institution
    Digital Systems Laboratory, Stanford University
  • Issue
    5
  • fYear
    1975
  • fDate
    5/1/1975 12:00:00 AM
  • Firstpage
    578
  • Lastpage
    584
  • Abstract
    A combinatorial procedure is given to calculate the reliability of an interwoven redundant logic network to any desired degree of accuracy. The procedure consists of enumerating combinations of gate failure which are tolerated by the redundant network, and is explained with reference to a quadded logic network. Since the exact reliability calculation might be too time consuming for large networks, a formula is given for a lower bound which can be used in conjunction with the exact method to give a very accurate reliability figure with a comparatively small computation time.
  • Keywords
    Fault pattern enumeration, interwoven redundant logic, quadded logic, reliability analysis; Circuit faults; Computer networks; Digital systems; Error correction; Integrated circuit interconnections; Jacobian matrices; Logic circuits; Logic design; Logic gates; Performance analysis; Fault pattern enumeration, interwoven redundant logic, quadded logic, reliability analysis;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/T-C.1975.224265
  • Filename
    1672858