• DocumentCode
    1118396
  • Title

    Base-collector junction capacitance of bipolar transistors operating at high current densities

  • Author

    Liou, Juin J.

  • Author_Institution
    University of Central Florida, Orlando, FL
  • Volume
    34
  • Issue
    11
  • fYear
    1987
  • fDate
    11/1/1987 12:00:00 AM
  • Firstpage
    2304
  • Lastpage
    2308
  • Abstract
    An analytical physics-based comprehensive base-collector junction capacitance model is presented. The model, which includes high-current effects, describes the base-collector space-charge-region capacitance for all operating regions, including the saturation region in which the space-charge region becomes forward biased. The present model is compared with the depletion capacitance model and significant discrepancies are predicted. An emitter-coupled logic gate circuit is used to demonstrate the practical usefulness of the model.
  • Keywords
    Bipolar transistors; Capacitance; Current density; Doping profiles; Electron mobility; Helium; Logic circuits; Logic gates; Predictive models; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1987.23236
  • Filename
    1486947