DocumentCode
1118720
Title
Properties of Faults and Criticalities of Values under Tests for Combinational Networks
Author
Wang, David T.
Author_Institution
System Products Division, IBM Corporation
Issue
7
fYear
1975
fDate
7/1/1975 12:00:00 AM
Firstpage
746
Lastpage
750
Abstract
This correspondence discusses the properties of faults in combinational networks and their relationships with fault-detection and fault-location test sets.
Keywords
Criticality of values under test, fault equivalence, fault detection, fault dominance, fault location, fault masking, test generation.; Decoding; Fault detection; Joining processes; Testing; Criticality of values under test, fault equivalence, fault detection, fault dominance, fault location, fault masking, test generation.;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/T-C.1975.224296
Filename
1672889
Link To Document