DocumentCode
1118747
Title
Efficient Verification of Hazard-Freedom in Gate-Level Timed Asynchronous Circuits
Author
Nelson, Curtis A. ; Myers, Chris J. ; Yoneda, Tomohiro
Author_Institution
Sch. of Eng., Walla Walla Coll., College Place, WA
Volume
26
Issue
3
fYear
2007
fDate
3/1/2007 12:00:00 AM
Firstpage
592
Lastpage
605
Abstract
This paper presents an efficient method for verifying hazard-freedom in gate-level timed asynchronous circuits. Timed circuits are a class of asynchronous circuits that are optimized using explicit timing information. In asynchronous circuits, correct operation requires that there are no hazards in the circuit implementation. Therefore, when designing an asynchronous circuit, each internal node and output of the circuit must be verified for hazard-freedom to ensure correct operation. Current verification algorithms for timed circuits require an explicit state exploration that often results in state explosion for even modest-sized examples. The goal of this paper is to abstract the behavior of internal nodes and utilize this information to make a conservative determination of hazard-freedom for each node in the circuit. Experimental results indicate that this approach is substantially more efficient than existing timing verification tools. These results also indicate that this method scales well for large examples that could not be previously analyzed, in that it is capable of analyzing these circuits in less than a second. While this method is conservative in that some false hazards may be reported, our results indicate that their number is small
Keywords
Monte Carlo methods; asynchronous circuits; response surface methodology; technological forecasting; current verification algorithms; gate level timed asynchronous circuits; hazard freedom; technology mapping; Asynchronous circuits; Circuit analysis; Circuit optimization; Circuit synthesis; Decoding; Explosions; Hazards; Libraries; Performance gain; Timing; Hazard-freedom; technology mapping; timed asynchronous circuits; verification;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2006.883912
Filename
4100757
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