Effect of RuO2 on the behavior of silver at thick-film terminations

In an attempt to understand the silver-glass interactions at the electrode/resistor terminations in hybrid integrated circuits, the behavior of silver in binary 75PbO-25SiO₂ glass containing up to 20 wt.% RuO₂ particles was studied between 650 and 850°. It is shown that the dissolution of silver into glass increases with increasing amount of RuO₂ particles. A different temperature dependence of dissolution was observed for RuO₂-free and RuO₂-doped glasses. Silver-ion-RuO ₂ interactions have been proposed as a possible mechanism responsible for the increased dissolution of silver in the glass