• DocumentCode
    1120719
  • Title

    Excimer laser-processed oxide-passivated silicon solar cells of 19.5-percent efficiency

  • Author

    Wood, R.F. ; Westbrook, R.D. ; Jellison, G.E., Jr.

  • Author_Institution
    Oak Ridge National Laboratory, Oak Ridge, TN
  • Volume
    8
  • Issue
    5
  • fYear
    1987
  • fDate
    5/1/1987 12:00:00 AM
  • Firstpage
    249
  • Lastpage
    251
  • Abstract
    Single-crystal p+ -n-n+ silicon solar cells with AM1.5 efficiencies exceeding 19.5 percent have been fabricated using glow-discharge implantation and pulsed excimer laser annealing, together with techniques for reducing the recombination current. These techniques include extrinsic passivation by thermal oxide growth and fine-line photolithography for metallization in order to reduce the area of metal-silicon contact. These are the highest efficiency ion-implanted nonconcentrator cells reported to date and to our knowledge they are the highest efficiency p-on-n cells made by any technique.
  • Keywords
    Annealing; Laser sintering; Metallization; Optical pulses; Passivation; Photovoltaic cells; Silicon; Surface discharges; Surface emitting lasers; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1987.26619
  • Filename
    1487169