• DocumentCode
    1120740
  • Title

    A high performance Josephson binary counter implemented in Nb and NbN technology

  • Author

    Whiteley, S.R. ; Kuo, F.

  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    2887
  • Lastpage
    2890
  • Abstract
    A Josephson binary counter with nondestructive readout has been implemented and tested in both niobium and niobium nitride technology. Successful operation of the Nb version has been observed. The design incorporates an additional tapered-edge SiO2 level in the Nb processing sequence, which increases interferometer inductance, decreases capacitance, and ensures that geometric resonances are as high in frequency as possible. This level has the added advantage of providing mask compatibility with the NbN process, as this level is skipped in the NbN flow, thereby compensating in part for the larger penetration depth of NbN. The counter cell is designed to be as compact as possible to minimize stray inductance and maximize top count rate and high count rate bias margins. A novel readout SQUID coupling layout that allows low read SQUID inductance and requires no holes in the groundplane is used. Coupling to the adjacent count SQUID is provided by a common control line level metallization, which directs count SQUID flux through the read SQUID loop. Nb versions of the circuit functioned as expected, but low device yield limited the longest chain of functioning stages to five. The NbN circuits did not function due to higher than predicted inductance values
  • Keywords
    Josephson effect; SQUIDs; counting circuits; niobium; niobium compounds; nondestructive readout; superconducting logic circuits; Josephson binary counter; NDRO; Nb processing sequence; NbN technology; common control line level metallization; compact cell design; geometric resonances; interferometer inductance; mask compatibility; nondestructive readout; readout SQUID coupling layout; tapered edge SiO2 level; Capacitance; Counting circuits; Coupling circuits; Frequency; Inductance; Metallization; Niobium compounds; Nondestructive testing; Resonance; SQUIDs;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133812
  • Filename
    133812