• DocumentCode
    1121460
  • Title

    Performance of a quarter-micrometer-gate ballistic electron HEMT

  • Author

    Awano, Yuji ; Kosugi, Makoto ; Mimura, Takashi ; Abe, Masayuki

  • Author_Institution
    Fujitsu Laboratories Ltd., Atsugi, Japan
  • Volume
    8
  • Issue
    10
  • fYear
    1987
  • fDate
    10/1/1987 12:00:00 AM
  • Firstpage
    451
  • Lastpage
    453
  • Abstract
    The electrical properties of a quarter-micrometer-gate HEMT have been studied by simulation and experiment. An IDSof 11 mA/50 µm, a gmof 500 mS/mm, and an fTof 110 GHz have been predicted by two-dimensional Monte Carlo simulation for certain conditions. The reasons underlying the high performance are discussed in terms of the electron dynamics in the device. A record room-temperature propagation delay time of 9.2 ps/gate at a power dissipation of 4.2 mW/ gate with the maximum transconductance of 400 mS/mm was obtained experimentally for a 0.28-µm-gate HEMT. Only a negligible short-channel effect was observed for reducing the gate length from 1.4 to 0.28 µm.
  • Keywords
    Electrons; Gallium arsenide; HEMTs; Intrusion detection; Large scale integration; Particle scattering; Power dissipation; Propagation delay; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1987.26691
  • Filename
    1487241