DocumentCode
1121460
Title
Performance of a quarter-micrometer-gate ballistic electron HEMT
Author
Awano, Yuji ; Kosugi, Makoto ; Mimura, Takashi ; Abe, Masayuki
Author_Institution
Fujitsu Laboratories Ltd., Atsugi, Japan
Volume
8
Issue
10
fYear
1987
fDate
10/1/1987 12:00:00 AM
Firstpage
451
Lastpage
453
Abstract
The electrical properties of a quarter-micrometer-gate HEMT have been studied by simulation and experiment. An IDS of 11 mA/50 µm, a gm of 500 mS/mm, and an fT of 110 GHz have been predicted by two-dimensional Monte Carlo simulation for certain conditions. The reasons underlying the high performance are discussed in terms of the electron dynamics in the device. A record room-temperature propagation delay time of 9.2 ps/gate at a power dissipation of 4.2 mW/ gate with the maximum transconductance of 400 mS/mm was obtained experimentally for a 0.28-µm-gate HEMT. Only a negligible short-channel effect was observed for reducing the gate length from 1.4 to 0.28 µm.
Keywords
Electrons; Gallium arsenide; HEMTs; Intrusion detection; Large scale integration; Particle scattering; Power dissipation; Propagation delay; Threshold voltage; Transconductance;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1987.26691
Filename
1487241
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