• DocumentCode
    1121623
  • Title

    SIS Mixers as a Noise Detector for Optimization of Photonic Local Oscillators in Terahertz Range

  • Author

    Kohjiro, Satoshi ; Kikuchi, Kenichi ; Maezawa, Masaaki ; Furuta, Tomofumi ; Wakatsuki, Atsushi ; Shimizu, Naofumi ; Nagatsuma, Tadao ; Kado, Yuichi ; Ito, Hiroshi ; Shoji, Akira

  • Author_Institution
    Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
  • Volume
    19
  • Issue
    3
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    389
  • Lastpage
    394
  • Abstract
    We have demonstrated that a superconductor-insulator-superconductor (SIS) mixer is applicable for a power detector to evaluate the sideband noise radiated from a submillimeter-wave local oscillator (LO) under development. A simple analysis shows SIS mixers provide better resolution of LO noise than Schottky barrier diode mixers when the available LO power is less than ~ 0.4 mW. Systematic measurement of dependence of receiver noise temperature T RX on components and operational conditions of a photonic LO (Ph-LO) is carried out, which provides a guide to their optimization, e.g., source-laser power, photodiode drive current, use of an optical filter, and selection of an optical amplifier. Noise temperature of the Ph-LO estimated from experimental results ranges from ~ 1 times 103 K to ~ 5 times 104 K as a function of operational conditions and parameters.
  • Keywords
    Schottky diode mixers; optical filters; optimisation; submillimetre wave oscillators; superconductor-insulator-superconductor mixers; SIS mixers; Schottky barrier diode mixers; noise detector; optical amplifier; optical filter; optimization; photodiode drive current; photonic local oscillators; source laser power; submillimeter-wave local oscillator; superconductor-insulator-superconductor mixer; Heterodyne receiver; SIS mixer; photonic local oscillator; sideband noise; terahertz;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2009.2017949
  • Filename
    5152991