• DocumentCode
    1121766
  • Title

    Multiple Resolution Texture Analysis and Classification

  • Author

    Peleg, Shmuel ; Naor, Joseph ; Hartley, Ralph ; Avnir, David

  • Author_Institution
    Center for Automation Research, University of Maryland, College Park, MD 20742; Department of Computer Science, the Hebrew University of Jerusalem, 91904 Jerusalem, Israel.
  • Issue
    4
  • fYear
    1984
  • fDate
    7/1/1984 12:00:00 AM
  • Firstpage
    518
  • Lastpage
    523
  • Abstract
    Textures are classified based on the change in their properties with changing resolution. The area of the gray level surface is measured at serveral resolutions. This area decreases at coarser resolutions since fine details that contribute to the area disappear. Fractal properties of the picture are computed from the rate of this decrease in area, and are used for texture comparison and classification. The relation of a texture picture to its negative, and directional properties, are also discussed.
  • Keywords
    Area measurement; Automation; Chemistry; Computer science; Educational institutions; Fractals; Length measurement; Performance analysis; Surface treatment; Vehicles; Fractals; fractal signature; multiresolution methods; texture classification;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.1984.4767557
  • Filename
    4767557