Characteristics of superconducting flux-flow transistors

Author

Hohenwarter, G.K.G. ; Martens, J.S. ; Thompson, J.H. ; Beyer, J.B. ; Nordman, J.E. ; Ginley, D.S.

Author_Institution

Hypres Inc., Elmsford, NY, USA

Volume

27

Issue

2

fYear

1991

fDate

3/1/1991 12:00:00 AM

Firstpage

3297

Lastpage

3300

Abstract

The operational characteristics and physics of three superconducting thin-film-based transistor structures are compared. The devices are based on the motion of quantized vortices, either Josephson fluxons in a long tunnel junction of Abrikosov fluxons in a superconducting film. The transistor amplification mechanism is accomplished by controlling magnetic field at the boundaries of the structures. An overview of the present understanding of device mechanisms and measured characteristics, including voltampere relations and small and large signal circuit parameters is provided. Demonstrated applications and anticipated limitations are discussed

Keywords

Josephson effect; flux flow; superconducting junction devices; superconducting thin films; Abrikosov fluxons; Josephson fluxons; circuit parameters; device mechanisms; magnetic field; operational characteristics; quantized vortices; superconducting flux-flow transistors; thin-film-based transistor structures; transistor amplification mechanism; voltampere relations; Circuits; Impedance; Josephson junctions; Magnetic field measurement; Magnetic fields; Physics; Superconducting films; Superconducting thin films; Thin film transistors; Voltage;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.133917

Filename

133917