DocumentCode
1122405
Title
Engineering Overdamped Niobium-Based Josephson Junctions for Operation Above 4.2 K
Author
Lacquaniti, Vincenzo ; Andreone, Domenico ; De Leo, Natascia ; Fretto, Matteo ; Sosso, Andrea ; Belogolovskii, Mikhail
Author_Institution
Electromagn. Dept., INRiM, Torino, Italy
Volume
19
Issue
3
fYear
2009
fDate
6/1/2009 12:00:00 AM
Firstpage
234
Lastpage
237
Abstract
Niobium-based junctions are still the best candidates for many small-scale applications of superconductivity and in particular, for the design and the fabrication of programmable voltage standards and D/A converters of fundamental accuracy. Non-hysteretic junctions with a large current density JC, and a reasonable characteristic voltage Vc are required, while, in order to make these circuits available to a wider market, operation at temperatures above 4.2 K would be important. In this work we report our results achieved on Nb/Al-AlOX/Nb junctions whose properties are studied in order to optimize the aforementioned features. Their behavior is analyzed showing how the overdamped characteristic is obtained with a less critical structure compared to other type of junctions. Moreover, using the scattering matrix approach, we have calculated a deviation of superconducting current-phase relation in such a SNIS Josephson junction from sinusoidal one and its effect on the current amplitudes of Shapiro steps as function of temperature. Measurement of the step dependence on temperature are also reported, where we considered the possibility of using both n = 1 and n = 2 RF step above 4.2 K, for a possible reduction of the number of junctions in array circuits.
Keywords
Josephson effect; aluminium; critical current density (superconductivity); niobium; D/A converters; Josephson Junctions; Nb-Al-AlO; current density; non-hysteretic junctions; programmable voltage standards; scattering matrix approach; superconducting current-phase relation; Josephson junctions; superconducting devices; voltage standard;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2009.2019072
Filename
5153063
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