DocumentCode
1123144
Title
Magnitude and phase characteristics of frequency modulation in directly modulated GaAlAs semiconductor diode lasers
Author
Welford, David ; Alexander, Stephen B.
Author_Institution
Massachusetts Institute of Technology, Lexington, MA, USA
Volume
3
Issue
5
fYear
1985
fDate
10/1/1985 12:00:00 AM
Firstpage
1092
Lastpage
1099
Abstract
The magnitude and phase of the small-signal injection current-to-frequency modulation transfer function in GaAlAs semiconductor diode lasers has been measured over the frequency range 100 Hz-1300 MHz using network analyzers. Channeled substrate planar (CSP), buried heterostructure (BH), and crank transverse junction stripe (TJS) laser structures were investigated and will be compared. Approximately 180, 180, and 90° phase differences between the low frequency, thermal frequency modulation (FM), and the high-frequency carrier-density FM was observed for BH, TJS, and CSP laser structures, respectively. The origin of this phase difference and its implications for FM optical communications will be discussed, A rate equation analysis for small-signal injection current modulation (using Mason´s flowgraph representation) indicates the presence of a real-axis left half-plane zero in the carrier-density small-signal frequency modulation response. Experimental evidence for this feature has been observed in the measured injection current-to-FM transfer functions.
Keywords
FM; Gallium materials/lasers; Current measurement; Frequency measurement; Frequency modulation; Optical fiber communication; Phase measurement; Phase modulation; Semiconductor diodes; Semiconductor lasers; Substrates; Transfer functions;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.1985.1074298
Filename
1074298
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