DocumentCode
1125332
Title
On Peculiarities of S-Parameter Measurements
Author
Rolain, Yves ; Van Moer, Wendy ; Jargon, Jeffrey A. ; DeGroot, Donald C.
Author_Institution
Vrije Univ. Brussels, Brussels
Volume
56
Issue
5
fYear
2007
Firstpage
1967
Lastpage
1972
Abstract
Extracting quantities, such as the propagation factor or the characteristic impedance of a transmission line based on measured S-parameters, can be more involved than expected. Experience teaches that even if the S-parameter measurements look smooth and are of good quality, the derived quantities can contain large spikes that tend to grow when connection imperfections are present. In this paper, the presence of the peaks is shown in practical measurements, a possible explanation for their presence is provided, and a sensitive indicator (the image parameters) for the imperfections is proposed.
Keywords
S-parameters; microwave measurement; transmission lines; S-parameter measurement; characteristic impedance; propagation factor; sensitive indicator; transmission line; Force measurement; Frequency measurement; Impedance measurement; Microwave measurements; Permittivity measurement; Propagation constant; Radio frequency; Scattering parameters; Transmission line measurements; Transmission lines; $S$ -parameters; Characteristic impedance; microwave measurements; propagation constant;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2007.895581
Filename
4303438
Link To Document