• DocumentCode
    1125332
  • Title

    On Peculiarities of S-Parameter Measurements

  • Author

    Rolain, Yves ; Van Moer, Wendy ; Jargon, Jeffrey A. ; DeGroot, Donald C.

  • Author_Institution
    Vrije Univ. Brussels, Brussels
  • Volume
    56
  • Issue
    5
  • fYear
    2007
  • Firstpage
    1967
  • Lastpage
    1972
  • Abstract
    Extracting quantities, such as the propagation factor or the characteristic impedance of a transmission line based on measured S-parameters, can be more involved than expected. Experience teaches that even if the S-parameter measurements look smooth and are of good quality, the derived quantities can contain large spikes that tend to grow when connection imperfections are present. In this paper, the presence of the peaks is shown in practical measurements, a possible explanation for their presence is provided, and a sensitive indicator (the image parameters) for the imperfections is proposed.
  • Keywords
    S-parameters; microwave measurement; transmission lines; S-parameter measurement; characteristic impedance; propagation factor; sensitive indicator; transmission line; Force measurement; Frequency measurement; Impedance measurement; Microwave measurements; Permittivity measurement; Propagation constant; Radio frequency; Scattering parameters; Transmission line measurements; Transmission lines; $S$-parameters; Characteristic impedance; microwave measurements; propagation constant;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2007.895581
  • Filename
    4303438