• DocumentCode
    112643
  • Title

    Projected Performance of Heterostructure Tunneling FETs in Low Power Microwave and mm-Wave Applications

  • Author

    Asbeck, Peter M. ; Kangmu Lee ; Jie Min

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California at San Diego, La Jolla, CA, USA
  • Volume
    3
  • Issue
    3
  • fYear
    2015
  • fDate
    May-15
  • Firstpage
    122
  • Lastpage
    134
  • Abstract
    Characteristics of heterostructure tunneling FETs (HTFETs) at microwave and mm-wave frequencies are reviewed, and their simulated performance in a variety of prototype circuits is presented. The results illustrate that HTFETs provide substantial benefits in low power, high frequency circuits, related to their high nonlinearity at low voltages (critical to rectifiers and mixers), as well as to their high transconductance and gain at low current and low power levels. Parasitic capacitance and noise models of HTFETs are summarized. mm-wave low noise amplifiers, oscillators, and mixers with simulated operation at power levels below 1 mW are described. High responsivity passive mm-wave detectors which could provide noise-equivalent temperature differences below 1 °C are presented.
  • Keywords
    high electron mobility transistors; low noise amplifiers; low-power electronics; millimetre wave amplifiers; millimetre wave mixers; millimetre wave oscillators; rectifiers; tunnel transistors; HTFET; heterostructure tunneling FET; high frequency circuits; low power microwave applications; mm-wave applications; mm-wave low noise amplifiers; mm-wave mixers; mm-wave oscillators; noise models; parasitic capacitance; passive mm-wave detectors; rectifiers; Capacitance; Integrated circuit modeling; Logic gates; MOSFET; Noise; Silicon; Tunneling FETs; low noise amplifiers; low power electronics; mm-wave detectors; noise in tunneling devices; voltage-controlled oscillators;
  • fLanguage
    English
  • Journal_Title
    Electron Devices Society, IEEE Journal of the
  • Publisher
    ieee
  • ISSN
    2168-6734
  • Type

    jour

  • DOI
    10.1109/JEDS.2015.2416320
  • Filename
    7066931