Weibull statistics in short-term dielectric breakdown of thin polyethylene films

Author

Cacciari, Matteo ; Mazzanti, G. ; Montanari, Gian

Author_Institution

Dipartimento di Elettrotecnica, Trieste Univ.

Volume

1

Issue

1

fYear

1994

fDate

2/1/1994 12:00:00 AM

Firstpage

153

Lastpage

159

Abstract

Results of electric strength tests performed on specimens cut from aged and unaged EPR-insulated HV cables are processed by the two and three parameter Weibull function. It is shown that the latter often fits the experimental data better than the former, but the difference is not significant, except, in a few cases, for the lowest percentiles. Therefore, the easier distribution parameter estimation and smaller confidence intervals of parameters and percentiles generally support the use of the two-parameter Weibull function

Keywords

cable insulation; electric breakdown of solids; electric strength; organic insulating materials; polymer films; power cables; rubber; EPR-insulated HV cables; Weibull statistics; confidence intervals; electric strength tests; parameter estimation; short-term dielectric breakdown; thin polyethylene films; two-parameter Weibull function; Aging; Dielectric breakdown; Dielectric thin films; Dielectrics and electrical insulation; Electrodes; Performance evaluation; Plastic films; Polyethylene; Statistics; Testing;

fLanguage

English

Journal_Title

Dielectrics and Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

1070-9878

Type

jour

DOI

10.1109/94.300243

Filename

300243