• DocumentCode
    1132493
  • Title

    Ten: A concurrent test engineering environment

  • Author

    Trischler, Erwin ; Johansson, Mats

  • Volume
    11
  • Issue
    3
  • fYear
    1994
  • Firstpage
    6
  • Keywords
    Automatic testing; Circuit faults; Circuit testing; Costs; Logic arrays; Logic circuits; Logic design; Logic testing; Product development; System testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1994.303843
  • Filename
    303843
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1132493