DocumentCode
1132515
Title
Simplifying sequential circuit test generation
Author
Sheu, Meng-Lieh ; Lee, Chung Len
Volume
11
Issue
3
fYear
1994
Firstpage
28
Keywords
Circuit faults; Circuit synthesis; Circuit testing; Controllability; Degradation; Design for testability; Flip-flops; Hardware; Sequential analysis; Sequential circuits;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1994.303845
Filename
303845
Link To Document