• DocumentCode
    1133350
  • Title

    An all-digital phase-locked loop for high-speed clock generation

  • Author

    Chung, Ching-Che ; Lee, Chen-Yi

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    38
  • Issue
    2
  • fYear
    2003
  • fDate
    2/1/2003 12:00:00 AM
  • Firstpage
    347
  • Lastpage
    351
  • Abstract
    An all-digital phase-locked loop (ADPLL) for high-speed clock generation is presented. The proposed ADPLL architecture uses both a digital control mechanism and a ring oscillator and, hence, can be implemented with standard cells. The ADPLL implemented in a 0.3-μm one-poly-four-metal CMOS process can operate from 45 to 510 MHz and achieve worst case frequency acquisition in 46 reference clock cycles. The power dissipation of the ADPLL is 100 mW (at 500 MHz) with a 3.3-V power supply. From chip measurement results, the Pk-Pk jitter of the output clock is <70 ps, and the root-mean-square jitter of the output clock is <22 ps. A systematic way to design the ADPLL with the specified standard cell library is also presented. The proposed ADPLL can easily be ported to different processes in a short time. Thus, it can reduce the design time and design complexity of the ADPLL, making it very suitable for system-on-chip applications.
  • Keywords
    CMOS digital integrated circuits; digital control; digital phase locked loops; frequency synthesizers; high-speed integrated circuits; integrated circuit design; jitter; system-on-chip; timing; 0.3 micron; 100 mW; 3.3 V; 45 to 510 MHz; SoC applications; all-digital PLLs; all-digital phase-locked loop; digital control mechanism; high-speed clock generation; one-poly-four-metal CMOS process; ring oscillator; standard cells; system-on-chip applications; CMOS process; Clocks; Digital control; Frequency; Jitter; Phase locked loops; Power dissipation; Power supplies; Ring oscillators; Semiconductor device measurement;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2002.807398
  • Filename
    1175517