DocumentCode
1133936
Title
Pseudospark switches for high repetition rates and high current applications
Author
Frank, Klaus ; Almen, Ortwin ; Bickel, Peter ; Christiansen, Jens ; Gortler, Andreas ; Hartmann, Werner ; Kozlik, Claudius ; Linsenmeyer, Aswin ; Loscher, Hermann ; Peter, Frank ; Schwandner, Alfred ; Stark, Robert
Author_Institution
Dept. of Phys., Erlangen Univ., Germany
Volume
80
Issue
6
fYear
1992
fDate
6/1/1992 12:00:00 AM
Firstpage
958
Lastpage
970
Abstract
The state-of-the-art of pseudospark switch (PSS) development is reported. In addition to the replacement of thyratrons for high power applications in TE-gas-discharge lasers, PSSs have been tested at high repetition rates up to 2 kHz. In order to minimize the erosion rate and to reduce total switch inductance, multichannel PSSs with various geometrical configurations have been investigated: linear, coaxial, and radial arrangements of the parallel discharge channels. All three configurations possess distinct advantages in pulsed power technology, i.e. linear systems fit well into striplines. Beyond this, PSSs gain increasing importance in high current devices like fast pinches, plasma foci, or powerful modulators, i.e. for magnetoforming. A single-channel switch for hold-off voltages up to 30 kV at peak currents of ≈100 kA has been tested for a damped sinusoidal pulse of a 5 μs duration at a repetition rate of up to 0.2 Hz, with and without electrode cooling
Keywords
pulsed power technology; spark gaps; switchgear; 100 kA; 30 kV; TE-gas-discharge lasers; damped sinusoidal pulse; electrode cooling; erosion rate; fast pinches; geometrical configurations; high current applications; high power applications; high repetition rates; hold-off voltages; magnetoforming; parallel discharge channels; plasma foci; powerful modulators; pseudospark switch; pulsed power technology; single-channel switch; total switch inductance; Coaxial components; Inductance; Laser applications; Linear systems; Plasma devices; Power lasers; Stripline; Switches; Testing; Thyratrons;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/5.149458
Filename
149458
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