• DocumentCode
    1134317
  • Title

    A semidistributed HEMT model for accurate fitting and extrapolation of S-parameters and noise parameters

  • Author

    Gardner, Peter ; Paul, D.K.

  • Volume
    40
  • Issue
    8
  • fYear
    1992
  • fDate
    8/1/1992 12:00:00 AM
  • Firstpage
    1709
  • Lastpage
    1712
  • Abstract
    A model is described for a low noise millimeter-wave HEMT device. It takes account of the distributed nature of the gate and drain electrodes by dividing the active region of the device into a number of slices. Each slice is modeled as an intrinsic HEMT with thermal noise sources and the slices are connected together through lossy reactances. The parameters of the first slice are made different from those of the remaining slices, in order to account for the inevitable differences in the field distribution in the gate feed region. The model parameters have been optimized numerically to fit the manufacturer´s measured S-parameters and all four noise parameters, for a commercially available HEMT chip. A good fit has been achieved simultaneously to all of these parameters, and the model therefore provides a reasonable basis for extrapolation to higher frequencies. The significance of the distributed gate effect and the unequal slice effect is assessed by comparing the best fit achievable when these effects are not included
  • Keywords
    S-parameters; extrapolation; high electron mobility transistors; semiconductor device models; solid-state microwave devices; S-parameters; active region; extrapolation; field distribution; gate feed region; lossy reactances; millimeter-wave HEMT device; noise parameters; semidistributed HEMT model; thermal noise sources; unequal slice effect; Electrodes; Extrapolation; Feeds; Fitting; Frequency; HEMTs; Noise measurement; Scattering parameters; Semiconductor device measurement; Virtual manufacturing;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.149534
  • Filename
    149534