DocumentCode
1134317
Title
A semidistributed HEMT model for accurate fitting and extrapolation of S-parameters and noise parameters
Author
Gardner, Peter ; Paul, D.K.
Volume
40
Issue
8
fYear
1992
fDate
8/1/1992 12:00:00 AM
Firstpage
1709
Lastpage
1712
Abstract
A model is described for a low noise millimeter-wave HEMT device. It takes account of the distributed nature of the gate and drain electrodes by dividing the active region of the device into a number of slices. Each slice is modeled as an intrinsic HEMT with thermal noise sources and the slices are connected together through lossy reactances. The parameters of the first slice are made different from those of the remaining slices, in order to account for the inevitable differences in the field distribution in the gate feed region. The model parameters have been optimized numerically to fit the manufacturer´s measured S-parameters and all four noise parameters, for a commercially available HEMT chip. A good fit has been achieved simultaneously to all of these parameters, and the model therefore provides a reasonable basis for extrapolation to higher frequencies. The significance of the distributed gate effect and the unequal slice effect is assessed by comparing the best fit achievable when these effects are not included
Keywords
S-parameters; extrapolation; high electron mobility transistors; semiconductor device models; solid-state microwave devices; S-parameters; active region; extrapolation; field distribution; gate feed region; lossy reactances; millimeter-wave HEMT device; noise parameters; semidistributed HEMT model; thermal noise sources; unequal slice effect; Electrodes; Extrapolation; Feeds; Fitting; Frequency; HEMTs; Noise measurement; Scattering parameters; Semiconductor device measurement; Virtual manufacturing;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.149534
Filename
149534
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