• DocumentCode
    1134722
  • Title

    An Algorithm for Testing Random Access Memories

  • Author

    Knaizuk, John, Jr. ; Hartmann, C.R.P.

  • Author_Institution
    Department of Computer Science, State University College
  • Issue
    4
  • fYear
    1977
  • fDate
    4/1/1977 12:00:00 AM
  • Firstpage
    414
  • Lastpage
    416
  • Abstract
    This correspondence presents an optimal algorithm to detect any single stuck-at-1 (s-a-1), stuck-at-0 (s-a-0) fault in a random access memory using only the n-bit memory address register input and m-bit memory buffer register input and output lines. It is shown that this algorithm requires 4 X 2nmemory accesses.
  • Keywords
    Fault detection, optimal algorithm, random access memory, single stuck-at-fault.; Automatic testing; Circuit faults; Circuit testing; Decoding; Fault detection; Hamming distance; Random access memory; Read-write memory; Registers; Sequential analysis; Fault detection, optimal algorithm, random access memory, single stuck-at-fault.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1977.1674851
  • Filename
    1674851
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1134722