Process-insensitive low-power design of switched-capacitor integrators

Author

Naiknaware, Ravindranath ; Fiez, Terri S.

Author_Institution

Maxim Integrated Products, Hillsboro, OR, USA

Volume

51

Issue

10

fYear

2004

Firstpage

1940

Lastpage

1952

Abstract

A generalized analytical technique is developed to design power optimized switched-capacitor integrators taking process variations into account. It is shown that the performance of a robustly designed power optimum switched-capacitor integrator is a monotonic function of the slew rate and the transconductance of the amplifier. The framework provides an analytical solution for fabrication foundry independent analog design and therefore eliminates the need for Monte Carlo simulations to estimate the effect of the worst-case performance variations. With this analytical approach, it is possible to migrate the design to technologies with smaller feature sizes while obtaining monotonic improvement in the performance. The validity of the proposed analytical model for the design of robust switched-capacitor integrators is demonstrated through transistor-level SPICE simulations using BSIM3v3 models.

Keywords

CMOS analogue integrated circuits; analogue-digital conversion; circuit optimisation; circuit simulation; digital-analogue conversion; integrated circuit design; integrating circuits; low-power electronics; mixed analogue-digital integrated circuits; switched capacitor filters; switched capacitor networks; BSIM3v3 models; CMOS analog integrated circuits; Monte Carlo simulations; amplifier transconductance; analog circuits; analog design; analog-digital conversion; circuit optimization; digital-analog conversion; mixed analog-digital integrated circuits; process variations; process-insensitive low-power design; slew rate; switched capacitor circuits; switched capacitor filters; switched-capacitor integrators; transistor-level SPICE simulations; yield optimization; Analytical models; Design optimization; Fabrication; Foundries; Performance analysis; Power amplifiers; Process design; Robustness; SPICE; Transconductance; A/D; Analog circuits; CMOS analog integrated circuits; D/A; analog–digital; circuit optimization; conversion; digital–analog; mixed analog-digital integrated circuits; switched capacitor circuits; switched capacitor filters; yield optimization;

fLanguage

English

Journal_Title

Circuits and Systems I: Regular Papers, IEEE Transactions on

Publisher

ieee

ISSN

1549-8328

Type

jour

DOI

10.1109/TCSI.2004.835666

Filename

1344218