Pulsed NVNA measurements for dynamic characterization of RF PAs

Author

Gibiino, Gian Piero ; Tafuri, Felice Francesco ; Nielsen, Troels S. ; Schreurs, Dominique ; Santarelli, Alberto

Author_Institution

Div. ESAT-TELEMIC, KU Leuven, Leuven, Belgium

fYear

2014

fDate

15-17 Dec. 2014

Firstpage

92

Lastpage

95

Abstract

Due to the ever increasing design complexity and bandwidth requirements, it has become increasingly more challenging to achieve an accurate large-signal characterization of modern Radio Frequency (RF) Power Amplifiers (PAs). This paper deals with such challenges presenting a handset PA characterization method using pulsed Continuous Wave (CW) RF excitation signals. It is shown how such measurements and quasi-static X-parameters, can be used to identify long term memory effects present in a commercially available power amplifier.

Keywords

network analysers; radiofrequency power amplifiers; CW excitation signals; RF PA; bandwidth requirements; design complexity; dynamic characterization; handset characterization method; large-signal characterization; long term memory effects; nonlinear vector network analyzer; pulsed NVNA measurements; pulsed continuous wave excitation signals; quasistatic X-parameters; radiofrequency power amplifiers; Delays; Harmonic analysis; Microwave measurement; Power measurement; Pulse measurements; Radio frequency; Semiconductor device measurement; Nonlinear Vector Network Analyzer; X-parameters; behavioral modeling; pulsed measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave and RF Conference (IMaRC), 2014 IEEE International

Conference_Location

Bangalore

Type

conf

DOI

10.1109/IMaRC.2014.7038978

Filename

7038978