Analysis of compounds released from various detector materials and their impact on aging Characteristics of proportional counters

Author

Andersson, H. ; Andersson, T. ; Heino, J. ; Huovelin, J. ; Kurvinen, K. ; Lauhakangas, R. ; Nenonen, S. ; Numminen, A. ; Ojala, J. ; Orava, R. ; Schultz, J. ; Sipilä, H. ; Vilhu, O.

Author_Institution

Metorex Int. Oy, Espoo, Finland

Volume

51

Issue

5

fYear

2004

Firstpage

2110

Lastpage

2118

Abstract

Outgassing properties of various detector materials have been studied. The thermal desorption tube method was used for sampling the compounds released from the materials. Analysis of the samples was carried out with a gas chromatograph/mass spectrometer analyzer. Attention was paid to compounds known to be easily polymerizing. Their impact on the aging characteristics of gaseous radiation detectors was studied by accelerated aging tests with the help of proportional counters. Styrene and some aromatic solvents were observed among the outgassing products of two different polyimide grades. In the accelerated aging tests both the styrene and the aromatic solvents were confirmed to cause a fast gain loss in the proportional counters filled with Ar/CH₄ gas mixture.

Keywords

ageing; argon; chromatography; gas mixtures; mass spectroscopy; materials properties; materials testing; organic compounds; outgassing; polymers; proportional counters; radiation effects; thermally stimulated desorption; Ar; accelerated aging tests; argon-methane gas mixture; aromatic solvents; detector materials; gas chromatograph/mass spectrometer analyzer; gaseous radiation detectors; outgassing properties; polyimide grades; polymerization; proportional counters; radiation hardness; released compound sampling; styrene; thermal desorption tube method; Accelerated aging; Argon; Counting circuits; Mass spectroscopy; Polyimides; Polymers; Radiation detectors; Sampling methods; Solvents; Testing; Aging; GC/MS; analysis; gas chromatograph/mass spectrometer; outgassing analysis; proportional counter; radiation hardness;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2004.835903

Filename

1344293