• DocumentCode
    1138414
  • Title

    Electric field dependence of luminescence due to alpha particles in gaseous xenon and the energy expended per photon

  • Author

    Saito, Masaki ; Nishikawa, Tsuguo ; Miyajima, Mitsuhiro

  • Author_Institution
    Graduate Sch. of Eng., Fukui Univ., Japan
  • Volume
    51
  • Issue
    5
  • fYear
    2004
  • Firstpage
    2125
  • Lastpage
    2130
  • Abstract
    The luminescence yield of gaseous xenon by alpha particles is measured as a function of electric field strength under the pressures of 1.0 and 2.0 atm. The luminescence yield rapidly decreases as increase of the electric field and reaches a constant yield at higher electric field strength. The constant luminescence yield suggests an average energy expended per photon (Ws) is determined from its value. In this study, the Ws is obtained to be 59.4±2.4 eV and the ratio of average luminescence yield to average ionization one is calculated to be 0.37±0.02, which agrees well with Platzman´s prediction.
  • Keywords
    electric fields; gamma-ray detection; gas scintillation detectors; ionisation chambers; luminescence; xenon; 1 atm; 2 atm; Platzman prediction; Xe; alpha particles; average ionization; constant luminescence yield; electric field dependence; electric field strength; energy expended per photon; energy resolution; gaseous xenon; ionization chamber; rare gas; scintillation yield; Alpha particles; Electric variables measurement; Energy measurement; Ionization chambers; Luminescence; Particle measurements; Photodiodes; Photomultipliers; Spontaneous emission; Xenon; Electric field dependence; energy expended per photon; energy resolution; ionization chamber; rare gas; scintillation yield; xenon;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.836030
  • Filename
    1344295