• DocumentCode
    1138995
  • Title

    Diagnosing Single Faults in Fanout-Free Combinational Circuits

  • Author

    Markowsky, George

  • Author_Institution
    Department of Computer Sciences, IBM T. J. Watson Research Center
  • Issue
    11
  • fYear
    1979
  • Firstpage
    863
  • Lastpage
    864
  • Abstract
    We show how to construct, in a simple manner, a test set having n + 1 tests for a fanout-free combinational circuit with n primary inputs which distinguishes (diagnoses) nonequivalent single faults. This result is an improvement over the upper bound in [1, Theorem 3.9] of n + g (g is the number of primary input gates) and the upper bound in [3, Theorem 4], [5] of 2n for the least number of tests required to distinguish among nonequivalent single faults.
  • Keywords
    Algorithm; diagnosing single faults; fanout-free combinatorial circuits; stuck line fault; test set; Boolean functions; Circuit faults; Circuit testing; Combinational circuits; Upper bound; Algorithm; diagnosing single faults; fanout-free combinatorial circuits; stuck line fault; test set;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1979.1675266
  • Filename
    1675266