• DocumentCode
    1139774
  • Title

    Proton energy dependence of the light output in gallium nitride light-emitting diodes

  • Author

    Khanna, Shyam M. ; Estan, Diego ; Erhardt, Lorne S. ; Houdayer, Alain ; Carlone, Cosmo ; Ionascut-Nedelcescu, Anca ; Messenger, Scott R. ; Walters, Robert J. ; Summers, Geoffrey P. ; Warner, Jeffrey H. ; Jun, Insoo

  • Author_Institution
    Defence Res. Establ. Ottawa, Ont., Canada
  • Volume
    51
  • Issue
    5
  • fYear
    2004
  • Firstpage
    2729
  • Lastpage
    2735
  • Abstract
    Gallium nitride (GaN)-based blue-emitting diodes (CREE Model C430-DH85) were irradiated at room temperature with protons in the energy range 2 to 115 MeV at fluences varying from 1×1011 to 1×1015 cm-2. Light output degradation curves were obtained for each energy and the damage constant (A) associated with these curves was determined according to the theory of Rose and Barnes. For proton energies less than 10 MeV, A varies inversely with the proton energy (E). At higher energies, A is consistently above the 1/E relationship. The change in nature of the energy dependence is attributed to nuclear interactions. Nonionizing energy loss calculations for the case of protons on GaN are presented. Good agreement between theory and experiment is obtained.
  • Keywords
    III-V semiconductors; energy loss of particles; gallium compounds; light emitting diodes; proton effects; quantum well devices; wide band gap semiconductors; 1/E relationship; 293 to 298 K; CREE Model C430-DH85; GaN; GaN-based blue LEDs; Rose and Barnes theory; damage constant; gallium nitride; light output degradation curves; nonionizing energy loss calculations; nuclear interactions; optoelectronics; proton energy dependence; quantum-well light-emitting diodes; radiation damage; room temperature; Atomic measurements; Degradation; Energy loss; Gallium nitride; III-V semiconductor materials; Laboratories; Light emitting diodes; Physics; Protons; Temperature measurement; Blue LEDs; NIEL; energy dependence; gallium nitride; light emission degradation; non-ionizing energy loss; optoelectronics; proton; quantum-well light-emitting diodes; radiation damage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.835097
  • Filename
    1344409