• DocumentCode
    1140403
  • Title

    Comment on "When to Use Random Testing"

  • Author

    Schneck, Paul B.

  • Author_Institution
    Goddard Space Flight Center
  • Issue
    8
  • fYear
    1979
  • Firstpage
    580
  • Lastpage
    581
  • Abstract
    This correspondence indicates a weakness in forming the criteria used to decide when random testing is practical. The use of average fan-in based on total gate count is an oversimplification and results in too low a threshold for use of random testing in lieu of a complete test of 2N patterns. A modification is given to avoid this difficulty.
  • Keywords
    Fan-in; primary inputs; Algebra; Computer aided software engineering; Costs; Filtering; Hardware; Indium tin oxide; Testing; Fan-in; primary inputs;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1979.1675415
  • Filename
    1675415