DocumentCode
1140403
Title
Comment on "When to Use Random Testing"
Author
Schneck, Paul B.
Author_Institution
Goddard Space Flight Center
Issue
8
fYear
1979
Firstpage
580
Lastpage
581
Abstract
This correspondence indicates a weakness in forming the criteria used to decide when random testing is practical. The use of average fan-in based on total gate count is an oversimplification and results in too low a threshold for use of random testing in lieu of a complete test of 2N patterns. A modification is given to avoid this difficulty.
Keywords
Fan-in; primary inputs; Algebra; Computer aided software engineering; Costs; Filtering; Hardware; Indium tin oxide; Testing; Fan-in; primary inputs;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1979.1675415
Filename
1675415
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