• DocumentCode
    1142324
  • Title

    Measures of the Effectiveness of Fault Signature Analysis

  • Author

    Smith, James E.

  • Author_Institution
    University of Wisconsin-Madison
  • Issue
    6
  • fYear
    1980
  • fDate
    6/1/1980 12:00:00 AM
  • Firstpage
    510
  • Lastpage
    514
  • Abstract
    A linear feedback shift register can be used to compress a serial stream of test result data. The compressed erroneous bit stream caused by a fault is said to form the "signature" of the fault. Since the bit stream is compressed, however, it is possible for an erroneous bit stream and the correct one to result in the same signature.
  • Keywords
    Data compression; dependent errors; fault detection; fault signature; linear feedback shift registers; Circuit faults; Circuit testing; Compression algorithms; Computer errors; Data compression; Digital systems; Electrical fault detection; Fault detection; Linear feedback shift registers; System testing; Data compression; dependent errors; fault detection; fault signature; linear feedback shift registers;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1980.1675610
  • Filename
    1675610
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1142324