• DocumentCode
    1142911
  • Title

    Timing-Based Placement Considering Uncertainty Due to Process Variations

  • Author

    Mahalingam, Venkataraman ; Ranganathan, Nagarajan

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Univ. of South Florida, Tampa, FL, USA
  • Volume
    18
  • Issue
    6
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    1007
  • Lastpage
    1011
  • Abstract
    In the nanometer regime, the effects of variations are having an increasing impact on the delay, power, and yield characteristics of devices. In this paper, we propose the use of fuzzy and stochastic mathematical programming techniques for variation aware timing-based incremental placement. The uncertainty due to process variations in these techniques, are modeled using fuzzy numbers and probabilistic constraints, respectively. The objective is to minimize the critical path delay of the circuit in the presence of variations considering gate and interconnect delays. In the fuzzy approach, the average and worst case deterministic optimizations are performed to identify the bounds and convert the uncertain fuzzy problem into a crisp nonlinear problem. The stochastic optimization framework, on the other hand, transforms the probabilistic constraints into a second-order conic program (SOCP) with explicit mean and variance values. The fuzzy and stochastic approaches tested on ITC´99 benchmark circuits yielded around 12.60% and 10.53% improvements in timing, when compared to optimization with the worst case process variations setting.
  • Keywords
    fuzzy set theory; probability; stochastic programming; timing circuits; fuzzy-stochastic mathematical programming techniques; nonlinear problem; probabilistic constraints; process variations; second-order conic program; variation aware timing-based incremental placement; Chance constrained programming; fuzzy programming; process variations; statistical optimization; timing-based placement (TBP);
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2009.2017540
  • Filename
    5169968