• DocumentCode
    1144832
  • Title

    SEC-DED Nonbinary Code for Fault-Tolerant Byte-Organized Memory Implemented with Quaternary Logic

  • Author

    Dao, T.T.

  • Author_Institution
    Fairchild Camera and Instrument Corporation
  • Issue
    9
  • fYear
    1981
  • Firstpage
    662
  • Lastpage
    666
  • Abstract
    Byte-organized memory requires an error control scheme which can handle errors involving one or several entire bytes. A special parallel nonbinary single error correction and double error detection SEC-DED block code is constructed by dynamic programming. This code is optimum in the sense that it lends itself to a simple and high-speed hardware implementation either in binary or in quaternary logic. A double extension field GF(22m) of the subfield GF(2m) is then introduced. As a design example, a(80,64) SED-DED code in GF(24) is constructed.
  • Keywords
    Byte-error correcting code; I; SEC/DED code; dynamic programming; fault-tolerant memory; multivalued Galois logic; nonbinary Hamming code; Bills of materials; Block codes; Computer errors; Costs; Dynamic programming; Error correction; Error correction codes; Fault tolerance; Hardware; Logic programming; Byte-error correcting code; I; SEC/DED code; dynamic programming; fault-tolerant memory; multivalued Galois logic; nonbinary Hamming code;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1981.1675864
  • Filename
    1675864