DocumentCode
1144832
Title
SEC-DED Nonbinary Code for Fault-Tolerant Byte-Organized Memory Implemented with Quaternary Logic
Author
Dao, T.T.
Author_Institution
Fairchild Camera and Instrument Corporation
Issue
9
fYear
1981
Firstpage
662
Lastpage
666
Abstract
Byte-organized memory requires an error control scheme which can handle errors involving one or several entire bytes. A special parallel nonbinary single error correction and double error detection SEC-DED block code is constructed by dynamic programming. This code is optimum in the sense that it lends itself to a simple and high-speed hardware implementation either in binary or in quaternary logic. A double extension field GF(22m) of the subfield GF(2m) is then introduced. As a design example, a(80,64) SED-DED code in GF(24) is constructed.
Keywords
Byte-error correcting code; I; SEC/DED code; dynamic programming; fault-tolerant memory; multivalued Galois logic; nonbinary Hamming code; Bills of materials; Block codes; Computer errors; Costs; Dynamic programming; Error correction; Error correction codes; Fault tolerance; Hardware; Logic programming; Byte-error correcting code; I; SEC/DED code; dynamic programming; fault-tolerant memory; multivalued Galois logic; nonbinary Hamming code;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1981.1675864
Filename
1675864
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