• DocumentCode
    1144870
  • Title

    Diagnosis of Systems with Asymmetric Invalidation

  • Author

    Holt, Craig S. ; Smith, James E.

  • Author_Institution
    Department of Electrical and Computer Engineering, University of Wisconsin
  • Issue
    9
  • fYear
    1981
  • Firstpage
    679
  • Lastpage
    690
  • Abstract
    This paper is concerned with system diagnosis through analysis of a set of diagnostic test results. It is assumed that a faulty unit may cause one or more tests on a good unit to fail, but may not cause tests on faulty units to pass (asymmetric invalidation). The system model employed is quite general; each test may be invalidated by any one of a set of units, and each test may completely test more than one unit. Conditions for diagnosability with and without repair are determined. Exact methods, as well as simpler approximate methods, are proposed for determining diagnosability and for performing diagnosis. The theory is extended to include diagnosis "by part" (where a part is a set of units). Several illustrative examples are included.
  • Keywords
    Asymmetric invalidation; diagnosable digital systems; diagnosis algorithm; diagnosis by part; fault-tolerant computing; graph models; t-readable sets; Automatic testing; Availability; Circuit faults; Circuit testing; Digital systems; Fault diagnosis; Fault tolerant systems; Performance evaluation; Reliability; System testing; Asymmetric invalidation; diagnosable digital systems; diagnosis algorithm; diagnosis by part; fault-tolerant computing; graph models; t-readable sets;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.1981.1675868
  • Filename
    1675868