• DocumentCode
    1145160
  • Title

    Degradation of gold-aluminium ball bonds by aging and contamination

  • Author

    Koeninger, V. ; Uchida, H.H. ; Fromm, E.

  • Author_Institution
    Inst. fur Werkstoffwissenschaft, Max-Planck-Inst. fur Metallforschung, Stuttgart, Germany
  • Volume
    18
  • Issue
    4
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    835
  • Lastpage
    841
  • Abstract
    The degradation of gold aluminium ball bonds has been studied by shear tests, resistivity measurements, micrographs, EDX and AES as a function of aging time at elevated temperatures and after various contamination treatments before and after bonding. Samples were subjected to ion etching treatment immediately before bonding in order to guarantee a comparable initial state. Incorporation of large amounts of Cl, Br, and F into the surface layer of the pad and other contamination treatments before bonding did not show detectable effects in subsequent annealing treatments as long as the bonding process itself has not been impeded by thick surface layers. The degradation process during annealing can be described as a three stage mechanism. Each stage can be clearly distinguished by the fracture behavior in the shear test, the morphology of the bond shown by the micrographs and by the change of contact resistivity
  • Keywords
    ageing; aluminium; annealing; contact resistance; gold; lead bonding; surface contamination; AES; Au-Al; EDX; aging; annealing; contact resistivity; contamination; degradation; fracture; gold-aluminium ball bonds; ion etching; micrographs; shear testing; Aging; Aluminum; Annealing; Bonding; Degradation; Gold; Surface contamination; Surface morphology; Surface treatment; Testing;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9886
  • Type

    jour

  • DOI
    10.1109/95.477471
  • Filename
    477471