DocumentCode
1145218
Title
Comments on "Observations on component infant mortality and burn-in effectiveness
Author
Marsh, W.
Volume
32
Issue
2
fYear
2009
fDate
6/1/2009 12:00:00 AM
Firstpage
521
Lastpage
522
Abstract
This paper presents the comments of the author on the work of Mr. Cooper (2008) by pointing out two concerns: First, the discussion of burn-in, and the tone of one of the major references (van der Pol et al. (1998)), would lead one to believe that burn-in is the only screen currently or commonly used to identify infant mortality or to detect substandard components. Second, it appears that Cooper´s assumptions regarding acceleration factors may be suitable in cases where burn-in is the only screen in use, where the defects are susceptible to the burn-in stresses, and where only a limited number of different failure modes are present.
Keywords
failure analysis; integrated circuit testing; acceleration factors; burn-in effectiveness; component infant mortality; failure mechanisms; failure modes; screening program; substandard component detection; Acceleration; Capacitors; Conferences; Electronic components; Fabrication; Physics; Temperature; Testing; Thermal stresses; Voltage;
fLanguage
English
Journal_Title
Components and Packaging Technologies, IEEE Transactions on
Publisher
ieee
ISSN
1521-3331
Type
jour
DOI
10.1109/TCAPT.2009.2023313
Filename
5170247
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