• DocumentCode
    1145218
  • Title

    Comments on "Observations on component infant mortality and burn-in effectiveness

  • Author

    Marsh, W.

  • Volume
    32
  • Issue
    2
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    521
  • Lastpage
    522
  • Abstract
    This paper presents the comments of the author on the work of Mr. Cooper (2008) by pointing out two concerns: First, the discussion of burn-in, and the tone of one of the major references (van der Pol et al. (1998)), would lead one to believe that burn-in is the only screen currently or commonly used to identify infant mortality or to detect substandard components. Second, it appears that Cooper´s assumptions regarding acceleration factors may be suitable in cases where burn-in is the only screen in use, where the defects are susceptible to the burn-in stresses, and where only a limited number of different failure modes are present.
  • Keywords
    failure analysis; integrated circuit testing; acceleration factors; burn-in effectiveness; component infant mortality; failure mechanisms; failure modes; screening program; substandard component detection; Acceleration; Capacitors; Conferences; Electronic components; Fabrication; Physics; Temperature; Testing; Thermal stresses; Voltage;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2009.2023313
  • Filename
    5170247