Modeling the effects of write field rise time on the recording properties in thin film media

Author

Thayamballi, Pradeep

Author_Institution

Read-Rite Corp., Fremont, CA, USA

Volume

32

Issue

1

fYear

1996

fDate

1/1/1996 12:00:00 AM

Firstpage

61

Lastpage

66

Abstract

A theory for including the effect of finite write field rise time in the calculation of written transition parameters for thin film media has been developed. Calculated dependence of transition parameter, overwrite and nonlinear transition shifts on the write field rise time are shown. Model results are compared with measured values for a thin film inductive head at different write current rise times and varying disk rotational velocity, for fixed linear density and flying height. The theory has also been used to calculate the amount of precompensation required to reduce the nonlinear shift to near zero

Keywords

magnetic recording; magnetic thin films; disk rotational velocity; inductive head; nonlinear transition shifts; overwrite; precompensation; recording properties; thin film media; transition parameters; write field rise time; Coercive force; Current measurement; Density measurement; Disk drives; Disk recording; Magnetic heads; Pulse measurements; Time measurement; Transistors; Writing;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.477551

Filename

477551