• DocumentCode
    1147053
  • Title

    Mean squared error: Love it or leave it? A new look at Signal Fidelity Measures

  • Author

    Wang, Zhou ; Bovik, Alan C.

  • Author_Institution
    Univ. of Waterloo, Waterloo, ON, Canada
  • Volume
    26
  • Issue
    1
  • fYear
    2009
  • Firstpage
    98
  • Lastpage
    117
  • Abstract
    In this article, we have reviewed the reasons why we (collectively) want to love or leave the venerable (but perhaps hoary) MSE. We have also reviewed emerging alternative signal fidelity measures and discussed their potential application to a wide variety of problems. The message we are trying to send here is not that one should abandon use of the MSE nor to blindly switch to any other particular signal fidelity measure. Rather, we hope to make the point that there are powerful, easy-to-use, and easy-to-understand alternatives that might be deployed depending on the application environment and needs. While we expect (and indeed, hope) that the MSE will continue to be widely used as a signal fidelity measure, it is our greater desire to see more advanced signal fidelity measures being used, especially in applications where perceptual criteria might be relevant. Ideally, the performance of a new signal processing algorithm might be compared to other algorithms using several fidelity criteria. Lastly, we hope that we have given further motivation to the community to consider recent advanced signal fidelity measures as design criteria for optimizing signal processing algorithms and systems. It is in this direction that we believe that the greatest benefit eventually lies.
  • Keywords
    mean square error methods; signal processing; MSE; mean squared error; signal fidelity measure; signal processing optimisation; Algorithm design and analysis; Distortion measurement; Dynamic range; Image processing; PSNR; Pixel; Pollution measurement; Signal design; Signal processing; Signal processing algorithms;
  • fLanguage
    English
  • Journal_Title
    Signal Processing Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1053-5888
  • Type

    jour

  • DOI
    10.1109/MSP.2008.930649
  • Filename
    4775883