A Class of Test Generators for Built-In Testing

Currently proposed and used schemes for built-in testing (B-I-T) use as test generators either binary counters (exhaustive testing), linear feedback shift registers (semiexhaustive testing), or ROM´s containing the test vectors (prestored testing). The disadvantages of these methods have been discussed in [4], and a store-and-generate B-I-T arrangement was proposed as a compromise between the exhaustive and the prestored form of test generation. Unfortunately, no systematic method was given for producing tests.