DocumentCode

1147730

Title

The Pattern Analysis and Machine Intelligence Technical Committee

Author

Bowyer, K.W. ; Price, K. ; Shafer, S. ; Boult, T. ; Shapiro, L.

Volume

28

Issue

12

fYear

1995

Firstpage

91

Keywords

Computer vision; Machine intelligence; Pattern analysis; Pattern recognition;

fLanguage

English

Journal_Title

Computer

Publisher

ieee

ISSN

0018-9162

Type

jour

DOI

10.1109/MC.1995.477620

Filename

477620