• DocumentCode
    114953
  • Title

    Design optimization and finite element analysis of AlN/3C-SiC piezoelectric bio-sensors

  • Author

    Iqbal, Azlan ; Mohd-Yasin, Faisal ; Dimitrijev, Sima

  • Author_Institution
    Queensland Micro- & Nanotechnol. Centre, Griffith Univ., Brisbane, QLD, Australia
  • fYear
    2014
  • fDate
    27-29 Aug. 2014
  • Firstpage
    509
  • Lastpage
    512
  • Abstract
    In this paper we present the design and simulation of a bio-sensor for pathogens detection based on AlN/3C-SiC/Si piezoelectric cantilever. Cubic silicon carbide (3C-SiC) is chosen as the base layer due to its excellent material properties and chemical inertness over silicon in harsh environmental conditions. Aluminum nitride (AlN) is selected as piezoelectric active layer due to its similar thermal expansion coefficient with silicon carbide to reduce thermal stress. The desired resonant frequency of 157.16 KHz is optimized using Matlab and the finite element analysis is carried out using COMSOL software to verify the shift in the resonant frequency due to the added mass of the bacteria. The surface functionalizations of the SiC as biosensor, as well as the fabrication recipes are also proposed.
  • Keywords
    aluminium compounds; biosensors; cantilevers; elemental semiconductors; finite element analysis; mathematics computing; microorganisms; optimisation; piezoelectric devices; silicon; silicon compounds; thermal expansion; thermal stresses; wide band gap semiconductors; AlN-3C-SiC piezoelectric biosensors; AlN-3C-SiC-Si piezoelectric cantilever; AlN-SiC-Si; COMSOL software; Matlab; base layer; chemical inertness; cubic silicon carbide; design optimization; finite element analysis; frequency 157.16 kHz; harsh environmental conditions; material properties; pathogens detection; piezoelectric active layer; resonant frequency; surface functionalizations; thermal expansion coefficient; thermal stress; Biosensors; III-V semiconductor materials; Resonant frequency; Silicon; Silicon carbide; Structural beams; 3C-SiC; Extreme environment; Microresonator; Pathogens; Piezoelectric; Si;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics (ICSE), 2014 IEEE International Conference on
  • Conference_Location
    Kuala Lumpur
  • Type

    conf

  • DOI
    10.1109/SMELEC.2014.6920910
  • Filename
    6920910