• DocumentCode
    1151626
  • Title

    Impact of a vertical Φ-shape transistor (VΦT) cell for 1 Gbit DRAM and beyond

  • Author

    Maeda, Shigenobu ; Maegawa, Shigeto ; Ipposhi, Takashi ; Nishimura, Hideki ; Kuriyama, H. ; Tanina, O. ; Inoue, Yasuyuki ; Nishimura, T.

  • Author_Institution
    ULSI Lab., Mitsubishi Electr. Corp., Itami, Japan
  • Volume
    42
  • Issue
    12
  • fYear
    1995
  • fDate
    12/1/1995 12:00:00 AM
  • Firstpage
    2117
  • Lastpage
    2123
  • Abstract
    We propose a vertical Φ-shape transistor (VΦT) cell for 1 Gbit DRAM and beyond. The VΦT is a vertical MOSFET whose gate surrounds its channel region like a Greek-alphabetic letter Φ, fabricated through the penetration of the gate electrode (=word line) which has been formed beforehand, and the formation of the channel plug inside the penetrating hole. The VΦT provides the 4F2 cell. The substantial simplicity of the VΦT process contributes to the reduction in the number of process steps. The above two features result in the drastic reduction in total chip cost. Moreover, we demonstrate that the advantages on electrical properties of the VΦT become more prominent with proceeding of scaling down. We have indicated that the VΦT is a promising candidate for the gigabit DRAM in terms of size, cost, and performance
  • Keywords
    CMOS memory circuits; DRAM chips; MOSFET; silicon-on-insulator; 1 Gbit; 4F2 cell; Si; channel plug; gigabit DRAM; vertical Φ-shape transistor cell; vertical MOSFET; Capacitors; Costs; DRAM chips; Electrodes; Helium; MOSFET circuits; Plugs; Random access memory; Tides; Ultra large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.477769
  • Filename
    477769