DocumentCode
1151638
Title
A useful and challenging take-home examination: characterization of an imaginary semiconductor sample
Author
Listerman, Thomas W.
Author_Institution
Dept. of Phys., Wright State Univ., Dayton, OH, USA
Volume
37
Issue
3
fYear
1994
fDate
8/1/1994 12:00:00 AM
Firstpage
319
Lastpage
321
Abstract
A take-home examination required students in a semiconductor device physics course to clarify their understanding of the properties of semiconductors. Students were given numerical values of measurements “made” on an imaginary semiconductor and then asked to determine the semiconductor´s physical characteristics
Keywords
educational courses; electronic engineering; semiconductor devices; imaginary semiconductor sample; measurements; physical characterization; semiconductor device physics course; students; take-home examination; Books; Cyclotrons; Data analysis; Equations; Magnetic field measurement; Physics; Resonance; Semiconductor device doping; Semiconductor devices; Semiconductor materials;
fLanguage
English
Journal_Title
Education, IEEE Transactions on
Publisher
ieee
ISSN
0018-9359
Type
jour
DOI
10.1109/13.312146
Filename
312146
Link To Document