DocumentCode
1151800
Title
Segmented Testing
Author
Robinson, John P.
Author_Institution
Department of Electrical and Computer Engineering, University of Iowa
Issue
5
fYear
1985
fDate
5/1/1985 12:00:00 AM
Firstpage
467
Lastpage
471
Abstract
The fraction of faults detected for a digital network is frequently high for the first few input combinations applied out of a set of test vectors. For on-line testing, there appears to be an advantage to splitting the test into segments which are applied at different times. It is shown that the expected time to error detection and the probability of an undetected double error can be reduced. The amount of reduction is dependent on the shape of the fault coverage curve. This approach may be applicable in fault-tolerant systems.
Keywords
Detection probability; fault coverage; fault tolerant; testing; Built-in self-test; Circuit faults; Circuit testing; Error correction; Fault detection; Fault tolerance; Fault tolerant systems; Logic gates; Shape; System testing; Detection probability; fault coverage; fault tolerant; testing;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/TC.1985.1676586
Filename
1676586
Link To Document