DocumentCode
1153078
Title
Prolog to: Leakage current mechanisms and leakage reduction techniques in deep-submicrometer cmos circuits
Author
Falk, Heiko
Volume
91
Issue
2
fYear
2003
Firstpage
303
Lastpage
304
Keywords
CMOS technology; Charge carrier processes; Circuits; Energy consumption; Leakage current; MOSFETs; Silicon; Subthreshold current; Threshold voltage; Tunneling;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/JPROC.2003.808154
Filename
1182064
Link To Document