DocumentCode
1154192
Title
A sensitivity-based approach to analyzing signal delay uncertainty of coupled interconnects
Author
Kulkarni, Medha ; Chen, Tom
Author_Institution
Sun Microsystems, Sunnyvale, CA, USA
Volume
24
Issue
9
fYear
2005
Firstpage
1336
Lastpage
1346
Abstract
Performance optimization is a critical step in the design of integrated circuits. Rapid advances in very large scale integration (VLSI) technology have enabled shrinking feature sizes, wire widths, and wire spacings, making the effects of coupling capacitance more apparent. As signals switch faster, noise due to coupling between neighboring wires becomes more pronounced. Changing the relative signal arrival times (RSATs) alters the victim line delay due to the varying coupling noise on the victim line. The authors propose a sensitivity-based method to analyze delay uncertainties of coupled interconnects due to uncertain signal arrival times at its inputs. Compared to existing methods of analyzing delay uncertainties of coupled interconnects, the simulation results show that the proposed method strikes a good balance between model accuracy and complexity compared to the existing approaches.
Keywords
VLSI; circuit CAD; circuit complexity; crosstalk; delays; failure analysis; fault simulation; integrated circuit design; integrated circuit interconnections; integrated circuit noise; sensitivity; timing; RSAT; VLSI technology; coupled interconnects; coupling capacitance; coupling noise; integrated circuits design; line delay; relative signal arrival times; sensitivity approach; signal delay uncertainty; signal switch; statistical timing; very large scale integration; Coupling circuits; Delay; Integrated circuit interconnections; Integrated circuit technology; Optimization; Signal analysis; Switches; Uncertainty; Very large scale integration; Wire; Coupled interconnects; delay changes; sensitivity; signal arrival times; statistical timing;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2005.852059
Filename
1501899
Link To Document