DocumentCode
1154254
Title
Eliminating false positives in crosstalk noise analysis
Author
Ran, Y. ; Kondratyev, A. ; Tseng, K.H. ; Watanabe, Y. ; Marek-Sadowska, M.
Author_Institution
Electr. & Comput. Eng. Dept., Univ. of California, Santa Barbara, CA, USA
Volume
24
Issue
9
fYear
2005
Firstpage
1406
Lastpage
1419
Abstract
Noise affects circuit operation by varying circuit delays and causing latches to capture incorrect values. Conventional noise analysis techniques can detect some of such noise faults, but accurate analysis requires a careful examination of timing and functional properties of the circuit. In this paper, a method of characterizing correlation of signal transitions in nets by considering in a unified way both timing and functionality of the signals is proposed. An analysis procedure to eliminate noise faults that cannot actually happen when such correlations are considered is described. The timed-Boolean logic is used to characterize signal transitions in a time interval, and correlations are checked by solving Boolean satisfiability (SAT) between aggressor and victim transitions under the min-max delay model for gates. The method is applicable for checking noise faults at a single net, on a path, or in a cone of logic. The proposed technique is scalable as it keeps the size of Boolean formulation linear to the size of the modeled circuit. It has been applied on a set of large circuits, eliminating up to 50% of noise delay faults reported by a conventional noise-analysis method.
Keywords
Boolean functions; VLSI; circuit CAD; circuit analysis computing; crosstalk; delays; failure analysis; formal verification; integrated circuit modelling; integrated circuit noise; logic design; Boolean logic; Boolean satisfiability; SAT; circuit delays; circuit functional property; circuit model; circuit operation; circuit timing property; crosstalk noise analysis; min-max delay model; noise delay faults; noise faults; signal transitions; Boolean functions; Circuit faults; Circuit noise; Crosstalk; Delay effects; Electrical fault detection; Fault detection; Latches; Logic; Timing; Crosstalk; noise; satisfiability (SAT); timed-Boolean logic;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2005.850829
Filename
1501904
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