• DocumentCode
    1154770
  • Title

    EMC Assessment at Chip and PCB Level: Use of the ICEM Model for Jitter Analysis in an Integrated PLL

  • Author

    Levant, Jean-Luc ; Ramdani, Mohamed ; Perdriau, Richard ; Drissi, M´hamed

  • Author_Institution
    ATMEL Nantes
  • Volume
    49
  • Issue
    1
  • fYear
    2007
  • Firstpage
    182
  • Lastpage
    191
  • Abstract
    This paper deals with the use of the integrated circuit electromagnetic model (ICEM) to analyze, predict, and optimize autocompatibility and electromagnetic emission at chip and system level. ICEM is currently under standardization process (IEC62014-3). The basic ICEM architecture is composed of a power distribution network model and an internal current source modeling digital activity. Such an approach enables the description of any kind of digital or mixed-signal design. This model is useful either for the IC manufacturer or the system manufacturer. The power distribution network of a printed circuit board (PCB) can be optimized using this model by choosing the number and the right values of decoupling capacitors as well as the size of power planes. The IC manufacturer may check out the autocompatibility of an IC and determine the number of power pins as well as the package to be used. As an example, jitter analysis of an integrated phase-locked-loop can be performed using ICEM. This paper demonstrates that this jitter can be predicted by simulation and that corrective solutions can be provided and checked out before implementation
  • Keywords
    electromagnetic compatibility; integrated circuit modelling; jitter; phase locked loops; printed circuits; EMC assessment; ICEM model; PCB level; autocompatibility; chip; electromagnetic emission; integrated PLL; integrated circuit electromagnetic model; integrated phase-locked-loop; internal current source modeling; jitter analysis; mixed-signal design; power distribution network model; printed circuit board; Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic modeling; Integrated circuit modeling; Jitter; Phase locked loops; Power system modeling; Power systems; Standardization; Virtual manufacturing; Application specific integrated circuit (ASIC); decoupling; integrated circuit electromagnetic model (ICEM); jitter; modeling; phase-locked-loop (PLL); prediction; simulation;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2006.888181
  • Filename
    4106090